![](/img/cover-not-exists.png)
[IEEE 2015 37th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - Reno, NV, USA (2015.9.27-2015.10.2)] 2015 37th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - ESD induced functional upset in magnetic sensor ICs
Dibra, Donald, Esmark, Kai, Jahn, Stefan, Motz, MarioYear:
2015
Language:
english
DOI:
10.1109/eosesd.2015.7314785
File:
PDF, 8.68 MB
english, 2015