[IEEE 2015 IEEE 61st Holm Conference on Electrical Contacts (Holm) - San Diego, CA, USA (2015.10.11-2015.10.14)] 2015 IEEE 61st Holm Conference on Electrical Contacts (Holm) - Investigation of electrical contacts on a nanometer scale using a Nano-manipulator in Scanning Electron Microscope
Kondo, Takaya, Toyoizumi, Jun, Onuma, Masanori, Shimizu, Tetsuo, Kawabata, Sumiko, Watanabe, Norimichi, Mori, KikuoYear:
2015
Language:
english
DOI:
10.1109/holm.2015.7355107
File:
PDF, 831 KB
english, 2015