[IEEE 2015 33rd IEEE International Conference on Computer Design (ICCD) - New York City, NY, USA (2015.10.18-2015.10.21)] 2015 33rd IEEE International Conference on Computer Design (ICCD) - Exploring well configurations for voltage level converter design in 28 nm UTBB FDSOI technology
Corsonello, Pasquale, Perri, Stefania, Frustaci, FabioYear:
2015
Language:
english
DOI:
10.1109/iccd.2015.7357157
File:
PDF, 593 KB
english, 2015