[IEEE 2004 24th International Conference on...

[IEEE 2004 24th International Conference on Microelectronics - Nis, Serbia (16-19 May 2004)] 2004 24th International Conference on Microelectronics (IEEE Cat. No.04TH8716) - Direct measurement of self-heating effects at the drift region of 600V PT-IGBTs

Perpina, X., Jorda, X., Godignon, P., Millan, J., von Kiedrowski, H., Vobecky, J., Mestres, N.

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Volume:

Year:

2004

Language:

english

DOI:

10.1109/icmel.2004.1314576

File:

PDF, 304 KB

english, 2004

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