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[IEEE 18th International Conference on Pattern Recognition (ICPR'06) - Hong Kong, China ()] 18th International Conference on Pattern Recognition (ICPR'06) - Robust Model Driven Matching Method for Face Analysis with Multi Image Photogrammetry
Schrotter, G., Li Zhang,Year:
2006
Language:
english
DOI:
10.1109/icpr.2006.1009
File:
PDF, 606 KB
english, 2006