![](/img/cover-not-exists.png)
[IEEE 18th International Conference on Pattern Recognition (ICPR'06) - Hong Kong, China ()] 18th International Conference on Pattern Recognition (ICPR'06) - Euclidean Quality Assessment for Binary Images
Chune Zhang,, Zhengding Qiu,, Dongmei Sun,, Jie Wu,Year:
2006
Language:
english
DOI:
10.1109/icpr.2006.508
File:
PDF, 160 KB
english, 2006