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[IEEE 18th International Conference on Pattern Recognition (ICPR'06) - Hong Kong, China ()] 18th International Conference on Pattern Recognition (ICPR'06) - Euclidean Quality Assessment for Binary Images

Chune Zhang,, Zhengding Qiu,, Dongmei Sun,, Jie Wu,
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Year:
2006
Language:
english
DOI:
10.1109/icpr.2006.508
File:
PDF, 160 KB
english, 2006
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