[IEEE 2007 14th International Symposium on the Physical and...

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[IEEE 2007 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Bangalore, India (2007.07.11-2007.07.13)] 2007 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits - A Strategy to Analyze Soft Reliability Issues Detected by Iddq Measurements

Osterreicher, I., Nowak, C., Eckl, S., Tippelt, B., Werner, W.
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Year:
2007
Language:
english
DOI:
10.1109/ipfa.2007.4378056
File:
PDF, 5.44 MB
english, 2007
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