[IEEE 2014 Fifth International Conference on Intelligent Systems Design and Engineering Applications (ISDEA) - Hunan, China (2014.6.15-2014.6.16)] 2014 Fifth International Conference on Intelligent Systems Design and Engineering Applications - Application of Atomic Force Microscopy to Assess a Copper Molten Mark Formed by Short Circuit
Ao, Gao, Chang-Zheng, Zhao, Gang, Pan, Fang, Xu, Man, Di, Wei, GaoYear:
2014
Language:
english
DOI:
10.1109/isdea.2014.55
File:
PDF, 778 KB
english, 2014