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[IEEE 2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005. - Chicago, Il, USA (8-12 Aug. 2005)] 2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005. - Statistical interpretation of autocorrelation coefficients for fields in mode-stirred chambers
Krauthauser, H.G., Winzerling, T., Nitsch, J., Eulig, N., Enders, A.Volume:
2
Year:
2005
Language:
english
DOI:
10.1109/isemc.2005.1513576
File:
PDF, 304 KB
english, 2005