[IEEE 1996 IEEE MTT-S International Microwave Symposium...

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[IEEE 1996 IEEE MTT-S International Microwave Symposium Digest - San Francisco, CA, USA (17-21 June 1996)] 1996 IEEE MTT-S International Microwave Symposium Digest - A universal method of accurate S-parameter extraction from FD-TD simulations applicable to oblique ports

Celuch-Marcysiak, M., Kozak, A., Gwarek, W.K.
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Volume:
2
Year:
1996
Language:
english
DOI:
10.1109/mwsym.1996.511004
File:
PDF, 293 KB
english, 1996
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