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[IEEE 2015 Annual Reliability and Maintainability Symposium (RAMS) - Palm Harbor, FL, USA (2015.1.26-2015.1.29)] 2015 Annual Reliability and Maintainability Symposium (RAMS) - Bayesian reliability modeling for pass/fail systems with sparse data
Li, Zhaojun Steven, Mense, Allan T.Year:
2015
Language:
english
DOI:
10.1109/rams.2015.7105190
File:
PDF, 327 KB
english, 2015