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[IEEE Oper. Center 2003 International Semiconductor Conference. CAS 2003 - Sinaia, Romania (28 Sept.-2 Oct. 2003)] 2003 International Semiconductor Conference. CAS 2003 Proceedings (IEEE Cat. No.03TH8676) - Electrical behavior of Si/SiO/sub 2/ nanocomposite films
Iancu, V., Jdira, L., Draghic, M., Mitroi, M.R., Balberg, I., Ciurea, M.L.Year:
2003
Language:
english
DOI:
10.1109/smicnd.2003.1251350
File:
PDF, 161 KB
english, 2003