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[IEEE 2015 IEEE International Test Conference (ITC) - Anaheim, CA, USA (2015.10.6-2015.10.8)] 2015 IEEE International Test Conference (ITC) - Evaluation of low-cost mixed-signal test techniques for circuits with long simulation times

Stratigopoulos, Haralampos-G., Barragan, Manuel J., Mir, Salvador, Le Gall, Herve, Bhargava, Neha, Bal, Ankur
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Year:
2015
Language:
english
DOI:
10.1109/test.2015.7342385
File:
PDF, 702 KB
english, 2015
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