Dependence of thin-film media microstructure and recording...

IEEE Transactions on Magnetics 2002 / 09 Vol. 38; Iss. 5

Dependence of thin-film media microstructure and recording properties on composition of very thin Cr-based seedlayers

Yoshimura, S., Djayaprawira, D.D., Mikami, M., Takakuwa, Y., Takahashi, M.
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Volume:
38
Language:
english
Journal:
IEEE Transactions on Magnetics
DOI:
10.1109/tmag.2002.802789
Date:
September, 2002
File:
PDF, 202 KB
english, 2002
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