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[IEEE 2015 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) - Bologna, Italy (2015.1.26-2015.1.28)] EUROSOI-ULIS 2015: 2015 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon - Low frequency noise statistical characterization of 14nm FDSOI technology node
Ioannidis, E. G., Theodorou, C. G., Haendler, S., Joo, M.-K., Josse, E., Dimitriadis, C. A., Ghibaudo, G.Year:
2015
Language:
english
DOI:
10.1109/ulis.2015.7063803
File:
PDF, 270 KB
english, 2015