[IEEE 2003 IEEE Ultrasonics Symposium - Honolulu, HI, USA...

[IEEE 2003 IEEE Ultrasonics Symposium - Honolulu, HI, USA (5-8 Oct. 2003)] IEEE Symposium on Ultrasonics, 2003 - Thin layer mechanical constants extraction using SAW and stratified Green functions - examples of SAW sensitivity to silica layer

Lardat, R., Steichen, W., Pastureaud, T., Ballandras, S., Laude, V.

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Year:

2003

Language:

english

DOI:

10.1109/ultsym.2003.1293412

File:

PDF, 77 KB

english, 2003

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