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[IEEE 2015 IEEE International Ultrasonics Symposium (IUS) - Taipei, Taiwan (2015.10.21-2015.10.24)] 2015 IEEE International Ultrasonics Symposium (IUS) - Ultrasonic flaw detection using Support Vector Machine classification
Virupakshappa, Kushal, Oruklu, ErdalYear:
2015
Language:
english
DOI:
10.1109/ultsym.2015.0128
File:
PDF, 1.02 MB
english, 2015