SPIE Proceedings [SPIE SPIE Advanced Lithography - San...

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SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, USA (Sunday 24 February 2013)] Extreme Ultraviolet (EUV) Lithography IV - Quencher distribution engineering for out-of-band insensitive EUV resists: experiments and stochastic simulation

Chien, Shang-Chieh, Naulleau, Patrick P., Chang, Shu-Hao, Wu, Jui-Ching, Chen, Jack J. H., Yen, Anthony
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Volume:
8679
Year:
2013
Language:
english
DOI:
10.1117/12.2010658
File:
PDF, 791 KB
english, 2013
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