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SPIE Proceedings [SPIE SPIE Optics + Optoelectronics - Prague, Czech Republic (Monday 15 April 2013)] Advances in X-ray Free-Electron Lasers II: Instrumentation - Beam characterization of FLASH from beam profile measurement by intensity transport equation and reconstruction of the Wigner distribution function
Schäfer, Bernd, Tschentscher, Thomas, Tiedtke, Kai, Mey, Tobias, Mann, Klaus, Keitel, Barbara, Kreis, Svea, Kuhlmann, Marion, Plönjes, Elke, Tiedtke, KaiVolume:
8778
Year:
2013
Language:
english
DOI:
10.1117/12.2016975
File:
PDF, 977 KB
english, 2013