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SPIE Proceedings [SPIE SPIE Optical Metrology 2013 - Munich, Germany (Monday 13 May 2013)] Optical Measurement Systems for Industrial Inspection VIII - Scanning fringe projection for fast 3D inspection
Honegger, Marc, Lehmann, Peter H., Osten, Wolfgang, Kahl, Michael, Trunz, Sandra, Albertazzi, Armando, Rinner, Stefan, Ettemeyer, Andreas, Lambelet, PatrickVolume:
8788
Year:
2013
Language:
english
DOI:
10.1117/12.2020260
File:
PDF, 2.18 MB
english, 2013