SPIE Proceedings [SPIE SPIE Optical Metrology 2013 - Munich, Germany (Monday 13 May 2013)] Optical Measurement Systems for Industrial Inspection VIII - Stimulated LIF studied using pulsed digital holography and modelling
Amer, Eynas, Lehmann, Peter H., Osten, Wolfgang, Stenvall, Jonas, Gren, Per, Albertazzi, Armando, Sjödahl, MikaelVolume:
8788
Year:
2013
Language:
english
DOI:
10.1117/12.2020505
File:
PDF, 412 KB
english, 2013