SPIE Proceedings [SPIE SPIE Optical Metrology 2013 -...

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SPIE Proceedings [SPIE SPIE Optical Metrology 2013 - Munich, Germany (Monday 13 May 2013)] Optical Measurement Systems for Industrial Inspection VIII - Stimulated LIF studied using pulsed digital holography and modelling

Amer, Eynas, Lehmann, Peter H., Osten, Wolfgang, Stenvall, Jonas, Gren, Per, Albertazzi, Armando, Sjödahl, Mikael
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Volume:
8788
Year:
2013
Language:
english
DOI:
10.1117/12.2020505
File:
PDF, 412 KB
english, 2013
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