SPIE Proceedings [SPIE SPIE Optical Metrology 2013 - Munich, Germany (Monday 13 May 2013)] Optical Measurement Systems for Industrial Inspection VIII - Non-Bayesian noise reduction in digital holography by random resampling masks
Bianco, Vittorio, Lehmann, Peter H., Osten, Wolfgang, Paturzo, Melania, Memmolo, Pasquale, Albertazzi, Armando, Finizio, Andrea, Javidi, Bahram, Ferraro, PietroVolume:
8788
Year:
2013
Language:
english
DOI:
10.1117/12.2020865
File:
PDF, 662 KB
english, 2013