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SPIE Proceedings [SPIE SPIE LASE - San Francisco, California, United States (Saturday 1 February 2014)] Laser-based Micro- and Nanoprocessing VIII - Compact probing system using remote imaging for industrial plant maintenance
Klotzbach, Udo, Washio, Kunihiko, Arnold, Craig B., Ito, F., Nishimura, A.Volume:
8968
Year:
2014
Language:
english
DOI:
10.1117/12.2037611
File:
PDF, 2.49 MB
english, 2014