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SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 17 August 2014)] Interferometry XVII: Advanced Applications - Simple setup for optical characterization of microlenses
Furlong, Cosme, Gorecki, Christophe, de Groot, Peter J., Novak, Erik L., Perrin, Stephane, Baranski, Maciej, Passilly, Nicolas, Froehly, Luc, Albero, Jorge, Bargiel, Sylwester, Gorecki, ChristopheVolume:
9204
Year:
2014
Language:
english
DOI:
10.1117/12.2061299
File:
PDF, 885 KB
english, 2014