SPIE Proceedings [SPIE International Symposium on Optoelectronic Technology and Application 2014 - Beijing, China (Tuesday 13 May 2014)] International Symposium on Optoelectronic Technology and Application 2014: Imaging Spectroscopy; and Telescopes and Large Optics - The error analyze of testing the large aperture flat by the Ritchey-Common method
Rolland, Jannick P., Yan, Changxiang, Kim, Dae Wook, Ma, Wenli, Zheng, Ligong, Ji, Bo, Xu, Chen, Li, BoVolume:
9298
Year:
2014
Language:
english
DOI:
10.1117/12.2071403
File:
PDF, 777 KB
english, 2014