![](/img/cover-not-exists.png)
SPIE Proceedings [SPIE International Symposium on Optoelectronic Technology and Application 2014 - Beijing, China (Tuesday 13 May 2014)] International Symposium on Optoelectronic Technology and Application 2014: Image Processing and Pattern Recognition - Identification method of satellite local components based on combined feature metrics
Sharma, Gaurav, Zhou, Fugen, Liu, Jennifer, Zhi, Xi-yang, Hou, Qing-yu, Zhang, Wei, Sun, XuanVolume:
9301
Year:
2014
Language:
english
DOI:
10.1117/12.2072693
File:
PDF, 436 KB
english, 2014