SPIE Proceedings [SPIE SPIE BiOS - San Francisco, California, United States (Saturday 7 February 2015)] Design and Quality for Biomedical Technologies VIII - Shack-Hartmann sensor based optical quality testing of whole slide imaging systems for digital pathology
Raghavachari, Ramesh, Liang, Rongguang, Pfefer, T. Joshua, Shakeri, S. M., Hulsken, Bas, van Vliet, Lucas J., Stallinga, SjoerdVolume:
9315
Year:
2015
Language:
english
DOI:
10.1117/12.2077085
File:
PDF, 1.65 MB
english, 2015