SPIE Proceedings [SPIE SPIE BiOS - San Francisco, California, United States (Saturday 7 February 2015)] Quantitative Phase Imaging - In-situ measurements of nanoscale phenomena using diffraction phase microscopy
Popescu, Gabriel, Park, YongKeun, Edwards, Chris, McKeown, Steven J., Hwang, Suk-Won, Froeter, Paul J., Li, Xiuling, Rogers, John A., Popescu, Gabriel, Goddard, Lynford L.Volume:
9336
Year:
2015
Language:
english
DOI:
10.1117/12.2080253
File:
PDF, 1.00 MB
english, 2015