SPIE Proceedings [SPIE IS&T/SPIE Electronic Imaging - San Francisco, California, United States (Sunday 8 February 2015)] Image Processing: Machine Vision Applications VIII - Multispectral imaging: an application to density measurement of photographic paper in the manufacturing process control
Lam, Edmund Y., Niel, Kurt S., Shrestha, Raju, Hardeberg, Jon YngveVolume:
9405
Year:
2015
Language:
english
DOI:
10.1117/12.2083280
File:
PDF, 796 KB
english, 2015