SPIE Proceedings [SPIE SPIE Optical Metrology - Munich,...

  • Main
  • SPIE Proceedings [SPIE SPIE Optical...

SPIE Proceedings [SPIE SPIE Optical Metrology - Munich, Germany (Sunday 21 June 2015)] Optical Measurement Systems for Industrial Inspection IX - An approach to defect inspection for packing presswork with virtual orientation points and threshold template image

Lehmann, Peter, Osten, Wolfgang, Albertazzi Gonçalves, Armando, Hao, Xiangyang, Liu, Songlin, Zhao, Fulai, Jiang, Lixing
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
9525
Year:
2015
Language:
english
DOI:
10.1117/12.2184628
File:
PDF, 301 KB
english, 2015
Conversion to is in progress
Conversion to is failed