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SPIE Proceedings [SPIE SPIE Optical Metrology - Munich, Germany (Sunday 21 June 2015)] Optical Measurement Systems for Industrial Inspection IX - An approach to defect inspection for packing presswork with virtual orientation points and threshold template image
Lehmann, Peter, Osten, Wolfgang, Albertazzi Gonçalves, Armando, Hao, Xiangyang, Liu, Songlin, Zhao, Fulai, Jiang, LixingVolume:
9525
Year:
2015
Language:
english
DOI:
10.1117/12.2184628
File:
PDF, 301 KB
english, 2015