![](/img/cover-not-exists.png)
SPIE Proceedings [SPIE SPIE Optical Metrology - Munich, Germany (Sunday 21 June 2015)] Optical Measurement Systems for Industrial Inspection IX - Diffusivity measurement using compact low cost field portable device based on light deflection
Lehmann, Peter, Osten, Wolfgang, Albertazzi Gonçalves, Armando, Chhaniwal, Vani, Mahajan, Swapnil, Trivedi, Vismay, Anand, ArunVolume:
9525
Year:
2015
Language:
english
DOI:
10.1117/12.2184789
File:
PDF, 1.12 MB
english, 2015