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SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 9 August 2015)] Advances in X-Ray/EUV Optics and Components X - Multilayer optics for monochromatic high-resolution x-ray imaging mircoscopes
Goto, Shunji, Morawe, Christian, Khounsary, Ali M., Troussel, Ph., Do, A., Gontier, D., Dennetiere, D., Høghøj, P., Hedacq, S.Volume:
9588
Year:
2015
Language:
english
DOI:
10.1117/12.2188185
File:
PDF, 1.19 MB
english, 2015