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SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 9 August 2015)] Applications of Digital Image Processing XXXVIII - Color normalization for robust evaluation of microscopy images
Tescher, Andrew G., Švihlík, Jan, Kybic, Jan, Habart, DavidVolume:
9599
Year:
2015
Language:
english
DOI:
10.1117/12.2188236
File:
PDF, 522 KB
english, 2015