SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 9 August 2015)] X-Ray Nanoimaging: Instruments and Methods II - Synchrotron-based transmission x-ray microscopy for improved extraction in shale during hydraulic fracturing
Lai, Barry, Kiss, Andrew M., Jew, Adam D., Joe-Wong, Claresta, Maher, Kate M., Liu, Yijin, Brown, Gordon E., Bargar, JohnVolume:
9592
Year:
2015
Language:
english
DOI:
10.1117/12.2190806
File:
PDF, 296 KB
english, 2015