SPIE Proceedings [SPIE International Conference on Optical Instruments and Technology 2015 - Beijing, China (Sunday 17 May 2015)] 2015 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems - Spectral calibration for infrared hyperspectral imaging Fourier transform spectrometer based on absorption peaks
Zhu, Jigui, Tam, Hwa-Yaw, Xu, Kexin, Xiao, Hai, Han, Sen, Li, YaSheng, Chen, Yan, Liao, Ningfang, Lyu, Hang, He, Shufang, Wan, LifangVolume:
9623
Year:
2015
Language:
english
DOI:
10.1117/12.2195687
File:
PDF, 411 KB
english, 2015