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SPIE Proceedings [SPIE Applied Optics and Photonics China (AOPC2015) - Beijing, China (Tuesday 5 May 2015)] AOPC 2015: Optical Test, Measurement, and Equipment - 3D micro profile measurement with the method of spatial frequency domain analysis
Han, Sen, Ellis, Jonathan D., Guo, Junpeng, Guo, Yongcai, Xu, YongxiangVolume:
9677
Year:
2015
Language:
english
DOI:
10.1117/12.2202973
File:
PDF, 419 KB
english, 2015