SPIE Proceedings [SPIE Applied Optics and Photonics China (AOPC2015) - Beijing, China (Tuesday 5 May 2015)] AOPC 2015: Image Processing and Analysis - An improved image sharpness assessment method based on contrast sensitivity
Shen, Chunhua, Yang, Weiping, Liu, Honghai, Zhang, Li, Tian, Yan, Yin, YiliVolume:
9675
Year:
2015
Language:
english
DOI:
10.1117/12.2203096
File:
PDF, 500 KB
english, 2015