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SPIE Proceedings [SPIE SPIE BiOS - San Francisco, California, United States (Saturday 13 February 2016)] Quantitative Phase Imaging II - Resolving the depth of fluorescent light by structured illumination and shearing interferometry
Popescu, Gabriel, Park, YongKeun, Schindler, Johannes, Elmaklizi, Ahmed, Voit, Florian, Hohmann, Ansgar, Schau, Philipp, Brodhag, Nicole, Krauter, Philipp, Frenner, Karsten, Kienle, Alwin, Osten, WolfVolume:
9718
Year:
2016
Language:
english
DOI:
10.1117/12.2212575
File:
PDF, 1.06 MB
english, 2016