SPIE Proceedings [SPIE Optical Systems Design 2005 - Jena,...

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SPIE Proceedings [SPIE Optical Systems Design 2005 - Jena, Germany (Monday 12 September 2005)] Optical Fabrication, Testing, and Metrology II - Limitations of iterative least squares methods in phase shifting interferometry in presence of vibrations

Schmit, Joanna, Munteanu, Florin
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Volume:
5965
Year:
2005
Language:
english
DOI:
10.1117/12.627764
File:
PDF, 286 KB
english, 2005
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