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SPIE Proceedings [SPIE Optical Engineering + Applications - San Diego, California, USA (Sunday 10 August 2008)] Interferometry XIV: Techniques and Analysis - Optical testing by means of one-dimensional interferograms performed with a point-diffraction interferometer
Rodríguez-Castillo, Luis, Schmit, Joanna, Creath, Katherine, Granados-Agustín, Fermín S., Cornejo-Rodríguez, Alejandro, Towers, Catherine E.Volume:
7063
Year:
2008
Language:
english
DOI:
10.1117/12.795582
File:
PDF, 552 KB
english, 2008