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SPIE Proceedings [SPIE Optical Engineering + Applications - San Diego, California, USA (Sunday 10 August 2008)] Interferometry XIV: Techniques and Analysis - Dynamic measurement of strain in test specimen by fringe projection
León-Huerta, Andrea, Schmit, Joanna, Creath, Katherine, Martinez, Amalia, Rayas, Juan Antonio, Towers, Catherine E., Cordero, RaúlVolume:
7063
Year:
2008
Language:
english
DOI:
10.1117/12.798278
File:
PDF, 743 KB
english, 2008