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SPIE Proceedings [SPIE International Symposium on Optomechatronic Technologies - San Diego, CA (Monday 17 November 2008)] Optomechatronic Technologies 2008 - Robust self-matching based focus measure
Otani, Yukitoshi, Li, Yuan, Takauji, Hidenori, Bellouard, Yves, Wen, John T., Kaneko, Shun'ichi, Tanaka, Takayuki, Hodko, Dalibor, Katagiri, Yoshitada, Ohmura, Isao, Kassegne, Samuel K., Kofman, JonatVolume:
7266
Year:
2008
Language:
english
DOI:
10.1117/12.816074
File:
PDF, 2.73 MB
english, 2008