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SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, USA (Sunday 1 August 2010)] Applications of Digital Image Processing XXXIII - The development of an automatic scanning path generation method for the spinneret test
Chen, Chun-Jen, Tescher, Andrew G., Hung, Min-Wei, Jywe, Wenyuh, Chiang, DonyauVolume:
7798
Year:
2010
Language:
english
DOI:
10.1117/12.859237
File:
PDF, 623 KB
english, 2010