SPIE Proceedings [SPIE IS&T/SPIE Electronic Imaging - San Francisco Airport, California, USA (Sunday 23 January 2011)] Computer Vision and Image Analysis of Art II - Polarized light scanning for cultural heritage investigation
Toque, Jay Arre, Murayama, Yusuke, Matsumoto, Yohei, Ide-Ektessabi, AriVolume:
7869
Year:
2011
Language:
english
DOI:
10.1117/12.876590
File:
PDF, 10.07 MB
english, 2011