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SPIE Proceedings [SPIE SPIE BiOS - San Francisco, California, USA (Saturday 21 January 2012)] Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XIX - Improved contrast by modal illumination in scanning reflectance confocal microscopy
Conchello, Jose-Angel, Glazowski, Christopher, Zavislan, James, Cogswell, Carol J., Wilson, Tony, Brown, Thomas G.Volume:
8227
Year:
2012
Language:
english
DOI:
10.1117/12.906438
File:
PDF, 3.97 MB
english, 2012