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SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, USA (Sunday 12 August 2012)] Developments in X-Ray Tomography VIII - Trends in the micro- and nanoComputed Tomography 2010-2012
Stock, S. R., Stock, Stuart R.Volume:
8506
Year:
2012
Language:
english
DOI:
10.1117/12.930157
File:
PDF, 320 KB
english, 2012