An Exact approach for Complete Test Set Generation of Toffoli-Fredkin-Peres based Reversible Circuits
Nagamani, A. N., Ashwin, S., Abhishek, B., Agrawal, V. K.Volume:
32
Language:
english
Journal:
Journal of Electronic Testing
DOI:
10.1007/s10836-016-5574-4
Date:
April, 2016
File:
PDF, 2.82 MB
english, 2016