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[IEEE 2010 IEEE 11th International Conference on Computer-Aided Industrial Design & Conceptual Design 1 - Yiwu, China (2010.11.17-2010.11.19)] 2010 IEEE 11th International Conference on Computer-Aided Industrial Design & Conceptual Design 1 - Technology investigation on developing fit garment patterns with different size in 2D and 3D CAD system

Yunchu, Yang
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Year:
2010
Language:
english
DOI:
10.1109/caidcd.2010.5681241
File:
PDF, 1.44 MB
english, 2010
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