[IEEE 2015 IEEE Conference on Computer Vision and Pattern...

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[IEEE 2015 IEEE Conference on Computer Vision and Pattern Recognition (CVPR) - Boston, MA, USA (2015.6.7-2015.6.12)] 2015 IEEE Conference on Computer Vision and Pattern Recognition (CVPR) - A metric parametrization for trifocal tensors with non-colinear pinholes

Leonardos, Spyridon, Tron, Roberto, Daniilidis, Kostas
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Year:
2015
Language:
english
DOI:
10.1109/cvpr.2015.7298622
File:
PDF, 185 KB
english, 2015
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