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[IEEE 2015 IEEE International Conference on Electro/Information Technology (EIT) - Dekalb, IL, USA (2015.5.21-2015.5.23)] 2015 IEEE International Conference on Electro/Information Technology (EIT) - Analysis of multiple classifier system using product and modified product rules
Hassan, Mohammed Falih, Abdel-Qader, IkhlasYear:
2015
Language:
english
DOI:
10.1109/eit.2015.7293334
File:
PDF, 3.13 MB
english, 2015